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HOME > Product > LED > Chip LED > LED Measurement System OPI-160
OPI-160
WAFER LEVEL LED MEASUREMENT SYSTEM
OPI-160 Wafer Level LED Measurement System is simple to measure various items and is available to
design custom-tailored software.
Optical Measurement
Spectrum, Peak/Dominant wavelength(p, d), CIE Color Coordinate(Cx, Cy), Luminous Intensity(Iv),
Correlated Color Temperature(CCT(Tc), Correlated color temperature), Color Rendering Index(CRI(Ra), Color rendering ability),
CIE XYZ, Radiant Flux, Luminous Flux, Spatial Intensity Distribution(light distribution, directional angle)
Electrical Measurement
Forward/ Reverse Current[lf, lr], Forward/Reverse Voltage[Vf, Vr], l-V-L Sweep
Temperature Dependence Measurement
Temperature.VS.Electrical/optical Test
Current Spreading and Degradation Analysis
Real time Image analysis of LED using CCD Camera and beam profiler software
Integrated measurement for optical / electrical / temperature dependency necessary for wafer level
Automated measurement and convenient user environment
Observation of Chip Current spreading and degradation via high magnification microscope and camera
Integrated functions and proven functions by many of researchers
CIE measurement mode and applied standard value of Korea Research Institute of Standards and Science retroactively
High precision measurement using Keithley 2612
Low noise, high precision and high productivity by TE Cooled 2048 pixel CCD sensor
It expresses characteristics of light distribution with 2, 3-dimensional graphs and data list by analyzing,
sorting and overlapping measured data