withlight

  • HOME
  • KOREAN
  • bullettitle

    • OPI-160WAFER LEVEL LED MEASUREMENT SYSTEM

      OPI-160 Wafer Level LED Measurement System is simple to measure various items and is available to
      design custom-tailored software.
      LED Measurement System
    • پ ׸ ϰ , user interface(ֹ Ʈ 谡)
    •  
    • Optical Measurement
    •    Spectrum, Peak/Dominant wavelength(p, d), CIE Color Coordinate(Cx, Cy), Luminous Intensity(Iv),
    •    Correlated Color Temperature(CCT(Tc), Correlated color temperature), Color Rendering Index(CRI(Ra), Color rendering ability),
         CIE XYZ, Radiant Flux, Luminous Flux, Spatial Intensity Distribution(light distribution, directional angle)
    •  
    • Electrical Measurement
    •    Forward/ Reverse Current[lf, lr], Forward/Reverse Voltage[Vf, Vr], l-V-L Sweep
    •  
    • Temperature Dependence Measurement
    •    Temperature.VS.Electrical/optical Test
    •  
    • Current Spreading and Degradation Analysis
    •    Real time Image analysis of LED using CCD Camera and beam profiler software
    •  
    • ߿
    •  
    • Integrated measurement for optical / electrical / temperature dependency necessary for wafer level
    • Automated measurement and convenient user environment
    • Observation of Chip Current spreading and degradation via high magnification microscope and camera
    • Integrated functions and proven functions by many of researchers
    •  
    •  
    • Ȯϰ ŷڼ ִ
    •  
    • CIE measurement mode and applied standard value of Korea Research Institute of Standards and Science retroactively
    • High precision measurement using Keithley 2612
    • Low noise, high precision and high productivity by TE Cooled 2048 pixel CCD sensor
    • It expresses characteristics of light distribution with 2, 3-dimensional graphs and data list by analyzing,
         sorting and overlapping measured data
    •