광전자정밀(주)

OPI-160 LED WAFER-LEVEL MEASUREMENT SYSTEM

다양한 항목을 간편하게 측정, User Interfae(주문형 소프트웨어 설계가능)
ㆍOptical Measurement
Spectrum, Peak/Dominant wavelength(λp, λd), CIE Color Coordinate(Cx, Cy 색좌표), Luminous Intensity(Iv,광도),
Correlated Color Temperature(CCT(Tc), 상관색 온도), Color Rendering Index(CRI(Ra), 연색성), CIE XYZ(삼자극치),
Radiant Flux, Luminous Flux(전광속), Spatial Intensity Distribution(배광, 지향각)
ㆍElectrical Measurement
Forward/ Reverse Current[lf, lr], Forward/Reverse Voltage[Vf, Vr], l-V-L Sweep
ㆍTemperature Dependence Measurement
Temperature.VS.Electrical/optical Test
ㆍCurrent Spreading and Degradation Analysis
Real time Image analysis of LED using CCD Camera and beam profiler software