Peak / Dominant Wavelength | p, d | Refer to LEOS(OPI-100) : Providing with all the items/specifications to measure In LEOS |
Luminous / Radiant Intensity | IV, Ie | |
CIE Color Coordinates | Cx, Cy | |
Half With | Hw | |
Reverse Current / Voltage | Ir, Vr | |
Forward Current / Voltage | If, Vf | |
*Luminous / Radiant Flux | ¥Õv, ¥Õe | |
CCT(Tc),CRI(Ra),Optical Efficacy(K) | ||
Light-Current-Voltage Sweep | ||
Power source | Max 1~10A, Pulse mode support (Optional) | |
Spectrum ranage | UV, UV~Visible, Visible, Visible~IR, IR, UV~IR ( Selectable ) | |
Optical Power | 0.0001 ~ 100 cd (Selectable) | |
Rank | Max 256Bin | |
Interface | Parallel/RS-232C/GPIB(Optional) | |
Data-storage format | Excel(*, CSV )/Text/Image(BMP) | |
Built-in PC | Windows XP, Pentium M 1.6G Hz , RAM 512 MB, HDD 80G, 17¡± LCD Monitor | |
Power | 100~230 VAC, 50/60 Hz | |
Available Temperature /Moisture | 5~40¡É/Less than 95% relative, non-condensing |
¤ýMeasure all electrical/optical properties and sweep in tester(LEOS)
¤ýDetect edge using SW
¤ýInk marking
¤ýRapid measurement speed : 0.3 sec / sample
¤ýModify, save and edit measurement conditions
¤ýEasy and simple station operation and wafer alignment
¤ýRanking and Mapping measurement data in accordance with user grade settings
¤ýStatistical processing and saving results (Graph, Mapping, Excel(*,CSV), Text, and BMP)
¤ýMeasurement data compatibility (Data compatibility with sorter)
¤ýOptimal user interface for quality management and R&D
¤ýTTL, RS232, GPIB interface ( TTL : input 8, output 10 (Adapted photo coupler)
¤ýActive mode settings for input/output port
¤ýProvide separate current for polarity measurement: 0~10Ma, provide spectrum measurement current: 0~1A
¤ýApply CIE measurement mode and KRISS standard.
¤ýHigh precision measurement using Keithley 2400.
¤ýLow noise, high precision and high reproduction rate using TE Cooled 2048 pixel CCD sensor.