¤ý Measure electroluminescence of LED epi wafer.
¤ý Measure upper/lower illumination of wafer by using glass.
¤ýHas measuring sensors in upper and lower parts.
¤ýEasy to move and contact to wafer toward xyz axis by using knob.
¤ýMaximize work convenience and productivity.
¤ýAccurate light receiving by using 2" integrating sphere for light head.
¤ýImprove measurement accuracy by using optical power meter andspectrometer at the same time.
¤ýhighly user friendly SW environment.
¤ýoptical properties measurement items.
- Spectral properties: Peak wavelength, dominant wavelength, mid-wavelength, center wavelength, Full width half max, color coordinate, purity, color temperature, Color rendering index , etc.
- Amount of light: luminous intensity, intensity radiation , etc.
¤ýElectrical property measurement items- forward current, forward voltage, reverse current, reverse voltage, etc.
¤ýSweep measurement items.
- current-voltage, voltage-current, current-optical properties.
¤ýMeasure Spectral properties using High sensitivity and resolution spectrometer.
¤ýEnsure accurate and stable measurement of optical power via real time color correction of PD using integrating sphere type input optical system andspectrometer.
¤ýMeasure electrical property using high speed and precision source meter.
¤ýMeasure up to 1A of current stressing.
¤ýMeasure current-voltage, voltage-current, current-optical Sweep.
¤ýSelect various Fourier domains. (UV, UV-VIS, VIS, VIS-IR)
¤ýSelect various power sources (voltage and current) stressing and measurement ranges by using Keithley2400 Sourcemeter.
¤ýAdditional features available as per user requirements. (Optional)
¤ý Intuitive recognition of measurement results- measurementspectrum, color coordinate, cumulatedspectrum,
¤ýDisplay results in list format or graph by measuring items, and mapping.
¤ýSetting up various conditions - User selected optical and electrical property items, and sweep measurement settings.
¤ýGrade setting function.
¤ýSave individual measurement value from upper and lower sensors and Total value.
¤ýSave data of temperature change over time. (Data and image file)
¤ýSave and open measurement conditions in a form of Project file.
¤ýProvide CIE and KS standard measurement mode.
¤ýCorrect using Korea Research Institute of Standards and Science certified lamp and LED.
¤ýProxy Korea Research Institute of Standards and Science(KRISS) correction certification. (Optional)
¤ýUser oriented set-up and instruction.
¤ýDevelop SW to meet user requirements.
¤ýProvide measurement knowledge and information through activities in CEI and photometry club.
¤ýRapid A/S: Support jig for measurement of various types of sample.
Voltage Range | ¡¾1§Å ~ ¡¾205V |
Current Range | ¡¾100pA to ¡¾1.0A |
Probe Station | 150mm Glass Plate X-Y Movement : 50 X 50mm Travel |
PD Temperature | 20¡É to 30¡É Áß ¼±ÅÃ, °íÁ¤ |
Spectrometer |
350 to 830nm, 2048 CCD array type |
Optical Head | 50mm Integrating Sphere |
Photodiode | 380 to 950nm, 10§± Area |