¤ýUniversal LED Tester System consists of Cryo cooler system for controlling extreme temperature and integrating sphere for measuring total Luminous flux ortotal radiation-flux of chip.
¤ýCryo cooler system is a chamber where you can put samples such as a piece of epi and chip wafe, LED unit ,etc and measures optical and electrical property of sample by flexibly changing temperature bewteen 10k~380k [Tempresolving power 0.1 ]
¤ýProbe station measures optical /electrical properties of epi and chip wafer.
¤ý6"integrating sphere calculates optical efficacy and measures Total Luminous flux andtotal radiation-flux of chip LED attached to TO can by measuring cryo cooler system and optical power to the change of temperature.
¤ýOptical properties measurement items.
- Spectral properties : Peak wavelength, dominant wavelength, mid-wavelength, center wavelength, Full width half max, color coordinate, purity, color temperature, Color rendering index , etc.
- The amount of lightproperties :Luminance, luminous intensity, intensity radiation, etc.
¤ýElectrical property measuring items.
- forward current, forward voltage, reverse current, reverse voltage, etc.
¤ýSweep measurement items.
- current-voltage, voltage-current, current-optical properties, Temp-Electrical property, and Temp-optical properties.
¤ýMeasure spectral properties using high sensitivity and resolution spectrometer.
¤ýAccurate and stable optical power by correcting color in real time using integrating sphere type input optical system andspectrometer.
¤ýMeasure electrical property using high precision and speed 4 channel source meter.
¤ýMeasure up to 3A of current stressing and print it out in consecutive and pulse format.
¤ýcurrent-voltage, voltage-current, current-optical sweep measurement.
¤ýMeasure optical and electrical properties to change of temperature and time.
¤ýSelect variousFourier domains(UV, UV-VIS, VIS, VIS-IR).
¤ýKeithSelect various power sources (Voltage, current, and pulse) stressing and measurement ranges using Keithley2420 Sourcementer.
¤ýAdditional features available upon user requirements. (Optional)
¤ýSimultaneous measurement of all channels or individual measurement for each channel when measuring multiple chips.
¤ýVarious conditional measurement.
- Repeated Aging Time measurement: Perform one time measurement by repeating the number of times after aging of sample for a certain amount of time.
- Aging Time measurement in certain interval: Perform measurement in certain interval after aging of sample for a certain amount of time.
¤ýThe measurement data is to be saved in a form that allows user to intuitively recognize the change ofoptical properties/electrical property. (CSV file)
¤ýSave data of temperature change over time. (Data and image file)
¤ýSave and open measurement conditions in a form of Project file.
¤ýProvide CIE and KS standard measurement mode.
¤ýCorrect using Korea Research Institute of Standards and Science certified lamp and LED.
¤ýProxy Korea Research Institute of Standards and Science(KRISS) correction certification. (Optional)
¤ýUser oriented set-up and instruction.
¤ýDevelop SW to meet user requirements.
¤ýProvide measurement knowledge and information through activities in CEI and photometry club service and prompt A/S
¤ýRapid A/S
Specifications | |
Voltage Range | ¡¾1¥ìV ~ ¡¾105V |
Current Range | ¡¾100pA to ¡¾3.5A, ¡¾10A[Pulse Only] |
Setting Temperature | 9K to 390K Resolution 0.1¡É |
PD Temperature | 20¡É to 30¡É Áß ¼±ÅÃ, °íÁ¤ |
Spectrometer | 350 to 900nm, 2048 CCD array Type |
Optical Head | 50mm integrating Sphere |
Photodiode | 350 to 900nm, 10§³ Area |
Dimension | 2,400mm[W] x 1,200mm[D] x 1,800mm[H] |