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OPI-110  MULTI-CHANNEL LEOS

Measure optical/electrical/thermal properties for various high output, multi-chip, and module LED/OLED as well as current stressing and measurement. Support up to 3A and consecutive/pulse type


  • Measure performance of high output, multi chip LED/OLED
  • ¤ýMeasure optical/electrical/thermal properties for various high output, multi-chip, and module LED/OLED.

  • ¤ýSupport up to 3A of current stressing and measurement and consecutive/pulse type.

  • Minimum pulse width: 1msec

  • ¤ýExtend source meter up to 32 channels.

  • ¤ýSupport adapters for various types of package.

  • Integrated measurement of optical/electrical/thermal properties
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    ¤ýHigh sensitivity and resolution spectrometer.

    - Peak wavelength, dominant wavelength, Full width half max, color coordinate, luminous intensity, velocity of light, intensity radiation, radiant flux, Correlated color temperature, Color rendering index, optical efficiency, etc.

    ¤ýHigh speed and precision Sourcemeter - forward/reverse current, voltage, and light - current - voltage sweep.

    ¤ýAdapt barrel and integrating sphere at the same time - Easy measurement for luminous intensity/total luminous flux items.

    ¤ýHigh resolution and power TE temp controller - Measure optical/electrical/thermal properties of target between 0~100¡É [Temp resolving power 0.1¡É]

    ¤ýLinked with thermal property meter, measure K-factor, temp on connected part, thermal resistance, and functional output. (Optional)


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  • Optimal for measurement of quality inspection and R&D reliability
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      ¤ýcurrent-voltage, voltage-current, current-light Sweep measurement.

    ¤ýMeasure optical/electrical/thermal properties by temp and time.

    ¤ýSelect various fourier domains. (UV, UV-VIS, VIS, VIS-IR)

    ¤ýSelect various types of optical fiber, SMA connector, and cosine collector.

    ¤ýMeasure power stressing and select measurement range using KeithleySourcemeter.

    ¤ýSupport special requirements for function. (Optional)

  • High user convenience
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    ¤ýSimultaneous measurement and saving of optical/electrical/thermal properties by one-click.

    ¤ýSet up 20 measurement conditions for electrical properties and consecutive measurement.

    ¤ýSet up to 10 current stressing conditions for optical property measurement. Consecutive measurement.

    ¤ýSet up measurement conditions, measure, save and view for each measuring target.

    ¤ýIntuitive recognition of result using spectrum and color coordinate.

    ¤ýCan be used as PC as equipped with high performance industrial computer.

    ¤ýSave results in text, Excel(*, CSV), and image. (BMP)