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OPI-175  EL TEST SYSTEM

Equipment to measure electrical and optical properties of LED epi wafer at the same time.


  • Measure EL property of LED epi
  • Measure electroluminescence of LED epi wafer.

  • Measure upper/lower illumination of wafer by using glass.

  • Has measuring sensors in upper and lower parts.

  • Easy to move and contact to wafer toward xyz axis by using knob.

  • Maximize work convenience and productivity.

  • Accurate light receiving by using 2" integrating sphere for light head.

  • Improve measurement accuracy by using optical power meter andspectrometer at the same time.

  • highly user friendly SW environment.

  • Integrated measurement of optical and electrical properties
  • optical properties measurement items.

  • - Spectral properties: Peak wavelength, dominant wavelength, mid-wavelength, center wavelength, Full width half max, color coordinate, purity, color temperature, Color rendering index , etc.

  • - Amount of light: luminous intensity, intensity radiation , etc.

  • Electrical property measurement items- forward current, forward voltage, reverse current, reverse voltage, etc.

  • Sweep measurement items.

  • - current-voltage, voltage-current, current-optical properties.

  • Measure Spectral properties using High sensitivity and resolution spectrometer.

  • Ensure accurate and stable measurement of optical power via real time color correction of PD using integrating sphere type input optical system andspectrometer.

  • Measure electrical property using high speed and precision source meter.

  • Measure up to 1A of current stressing.

  • Optimized for QA and R&D
  • Measure current-voltage, voltage-current, current-optical Sweep.

  • Select various Fourier domains. (UV, UV-VIS, VIS, VIS-IR)

  • Select various power sources (voltage and current) stressing and measurement ranges by using Keithley2400 Sourcemeter.

  • Additional features available as per user requirements. (Optional)

  • Highly friendly user environment
  • Intuitive recognition of measurement results- measurementspectrum, color coordinate, cumulatedspectrum,

  • Display results in list format or graph by measuring items, and mapping.

  • Setting up various conditions - User selected optical and electrical property items, and sweep measurement settings.

  • Grade setting function.

  • Save individual measurement value from upper and lower sensors and Total value.

  • Save data of temperature change over time. (Data and image file)

  • Save and open measurement conditions in a form of Project file.

  • Accurate and stable measurement
  • Provide CIE and KS standard measurement mode.

  • Correct using Korea Research Institute of Standards and Science certified lamp and LED.

  • Proxy Korea Research Institute of Standards and Science(KRISS) correction certification. (Optional)

  • Technical support and maintenance
  • User oriented set-up and instruction.

  • Develop SW to meet user requirements.

  • Provide measurement knowledge and information through activities in CEI and photometry club.

  • Rapid A/S: Support jig for measurement of various types of sample.

  • Voltage Range ±1㎶ ~ ±205V
    Current Range ±100pA to ±1.0A
    Probe Station 150mm Glass Plate
    X-Y Movement : 50 X 50mm Travel
    PD Temperature 20℃ to 30℃ 중 선택, 고정
    Spectrometer
    350 to 830nm, 2048 CCD array type
    Optical Head 50mm Integrating Sphere
    Photodiode 380 to 950nm, 10㎟ Area